Accessories for the CS3000 range

Beam Blanking

• Ultra high speed (<10nsec RT/FT) unit.
• Located very close to the electron source, conjugate to the focal plane,
• ensuring no significant movement during blanking rise/fall cycle.
• Provided with micrometer alignment (X/Y) for setting on the optical axis.
• Independently adjusted knife edge for setting the correct blanking
• conditions and ensuring maximum sensitivity.
• The blanking voltage enables beam blanking operation to 50kV with
• a +5V (minimum) drive to the plates.
• Recommended that impedance matching to either 50-100O is
• provided at the column connector to ensure that rise/fall times of
• <10nsec are achieved with normal pulse driven electronics
• (normally supplied by user).
• CamScan can provide a power pulse amplifier (with no duty
• restrictions) if required.

Beam Current Stability Module

• Enhanced beam stability control
• <0.05% / hour maximum drift over a minimum period of 64 hours.

Laser Beam Locator

• A low powered red laser beam, co-axial with the electron optic axis in the column, illuminates precisely the centre of the area to be scanned by the electron beam.
• Beam sensitive or complex large samples can be very easily positioned for microscopy and analysis.

Auto Faraday Cage

• Pneumatically controlled turret which, on command, swings the
• Faraday Cage into the electron beam.
• Accurate digital read out of probe current displayed on Absorbed
• Current Imaging module.
• Particularly useful for probe current measurement during quantitative
• X-ray microanalysis without the need to move sample or stage.

Stereo Optical Microscope

• Used in conjunction with the Laser Beam Locator.
• Stereoscopic and Vertical Beam observation.
• Ideal for inclined viewing of samples set for EDX analysis.
• Magnification Range x6.4 to x40.
• Continuous zoom x1 to x6.
• Complete with High Power automatic illuminator with fibre optic light guides.

Selected Area Diffraction

• SAD scan coil and electron optic column module to acquire selected area diffraction (channelling patterns from areas as small as 10µm diameter.
• The SAD coil is attached to the standard SEM aperture selector unit.